发明名称 Electrode for silicon carbide semiconductor, silicon carbide semiconductor element comprising the electrode, and production method therefor
摘要 An ohmic electrode for an SiC semiconductor includes a p-type Si layer formed on the surface of a p-type SiC semiconductor, and a metal silicide layer formed on the surface of the Si layer, the metal silicide layer being formed from a metal silicide such as PtSi. The p-type Si layer is preferably formed from p-type Si having a carrier concentration equal to or higher than that of the aforementioned p-type SiC. Preferably, the ohmic electrode is formed as follows: deposition of Si is performed; deposition of a metal silicide is performed by means of laser ablation; laser irradiation is performed to thereby improve ohmic properties and enhance adhesion between the resultant deposition layer and the p-type SiC semiconductor; and then further deposition of the metal silicide is performed by means of laser ablation.
申请公布号 US2002145145(A1) 申请公布日期 2002.10.10
申请号 US20020105269 申请日期 2002.03.26
申请人 NGK SPARK PLUG CO., LTD. 发明人 NAKASHIMA KENSHIRO;OKUYAMA YASUO;YOKOI HITOSHI;OSHIMA TAKAFUMI
分类号 H01L21/28;H01L21/04;H01L29/24;H01L29/45;H01L29/861;(IPC1-7):H01L31/031 主分类号 H01L21/28
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