| 摘要 |
PURPOSE: A beam structure measurement method and measurement instrument is provided to achieve improved accuracy and efficiency by measuring deviation of flange portion through the use of the bent measurement instrument at both sides of the beam. CONSTITUTION: A beam structure measurement method, comprises a first step of permitting a measurement instrument which is perpendicularly bent so as to correspond to the shape of each flange portion of an H-beam, to tightly contact the side surface of the H-beam; a second step of obtaining deviation values by measuring gaps formed between flange portions of the H-beam where the measurement instrument tightly contacts; and a third step of performing an arithmetic operation so as to obtain an accurate deviation value by using the deviation values for the H-beam obtained in the second step. |
