TEST PROBE CARD AND METHOD OF ALIGNING THE SAME

摘要

PURPOSE: A test probe card and method of aligning the same is provided to be capable of preventing a probe card from being recognized erroneously even at repeatedly aligning a reference point of a probe needle. CONSTITUTION: A rectangle needle part(129) is formed at the center of a circular probe card so as to penetrate a surface. A plurality of needles(1291,1293) are mounted along the periphery of the needle part(129). The needles(1291,1293) are projected from each corner of the needle part(129) so as to be contacted with a chip formed on a semiconductor substrate. The needles(1291,1293) are bent downward. Each of the needles(1291,1293) forms a group of needles in which an align needle(1291) is comprised. The needle part(129) consists of four needle groups(A,B,C,D) each of which comprises an align needle(1291).