发明名称 SUBSTRATE TREATMENT APPARATUS AND SUBSTRATE TREATMENT METHOD
摘要 <p>PROBLEM TO BE SOLVED: To realize the good treatment of a substrate by preventing the stagnation of liquid drops on a member approaching a substrate holding means after the treatment of the substrate to suppress the generation of particles. SOLUTION: A release pawl 70 for releasing the holding of a wafer by a spinning chuck is equipped with an arm part 71 and the pawl part 72 integrally formed to the leading end of the arm part 71. The upper surface of the arm part 71 comprises a pair of inclined surfaces 71a and 71b. A through-hole 74 is formed to the pawl part 72 and the upper surface of the pawl part 72 has downward inclined surfaces 75 inwardly going toward the through-hole 74.</p>
申请公布号 JP2003039007(A) 申请公布日期 2003.02.12
申请号 JP20010228067 申请日期 2001.07.27
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 NAKAGAWA HITOSHI
分类号 G02F1/13;B05C11/00;B05C11/08;B05D3/00;B08B3/02;G02F1/1333;G11B5/84;G11B7/26;H01L21/304;H01L21/306;H01L21/68;H01L21/683;(IPC1-7):B05C11/08;G02F1/133 主分类号 G02F1/13
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