发明名称 |
RGB-IR PHOTOSENSOR WITH NONUNIFORM BURIED P-WELL DEPTH PROFILE FOR REDUCED CROSS TALK AND ENHANCED INFRARED SENSITIVITY |
摘要 |
A front-side-interconnect (FSI) red-green-blue-infrared (RGB-IR) photosensor array has photosensors of a first type with a diffused N-type region in a P-type well, the P-type well diffused into a high resistivity semiconductor layer; photosensors of a second type, with a deeper diffused N-type region in a P-type well, the P-type well; and photosensors of a third type with a diffused N-type region diffused into the high resistivity semiconductor layer underlying all of the other types of photosensors. In embodiments, photosensors of a fourth type have a diffused N-type region in a P-type well, the N-type region deeper than the N-type region of photosensors of the first and second types. |
申请公布号 |
US2016358969(A1) |
申请公布日期 |
2016.12.08 |
申请号 |
US201514731707 |
申请日期 |
2015.06.05 |
申请人 |
OmniVision Technologies, Inc. |
发明人 |
Fu Zhenhong;Yang Dajiang;Yi Xianmin;Chen Gang;Hu Sing-Chung;Mao Duli |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A front-side imaging (FSI) red-green-blue-infrared (RGB-IR) photosensor array comprising:
a plurality of photosensors of a first type, where each photosensor of the first type comprises a diffused N-type region in a P-type well, the P-type well diffused into a high resistivity semiconductor layer; a plurality of photosensors of a second type, where each photosensor of the second type comprises a diffused N-type region in a P-type well, the P-type well diffused into the high resistivity semiconductor layer; a plurality of photosensors of a third type, where each photosensor of the third type comprises a diffused N-type region diffused into the high resistivity semiconductor layer; where the diffused N-type regions of the photosensors of the first type are diffused to a first depth; the diffused N-type regions of the photosensors of the second type are diffused to a second depth, the first and second depth being different; and where the P− type wells of the photosensors of the first type are diffused to a third depth; the P− wells of the photosensors of the second type are diffused to a fourth depth, the third and fourth depth being different. |
地址 |
Santa Clara CA US |