发明名称 RGB-IR PHOTOSENSOR WITH NONUNIFORM BURIED P-WELL DEPTH PROFILE FOR REDUCED CROSS TALK AND ENHANCED INFRARED SENSITIVITY
摘要 A front-side-interconnect (FSI) red-green-blue-infrared (RGB-IR) photosensor array has photosensors of a first type with a diffused N-type region in a P-type well, the P-type well diffused into a high resistivity semiconductor layer; photosensors of a second type, with a deeper diffused N-type region in a P-type well, the P-type well; and photosensors of a third type with a diffused N-type region diffused into the high resistivity semiconductor layer underlying all of the other types of photosensors. In embodiments, photosensors of a fourth type have a diffused N-type region in a P-type well, the N-type region deeper than the N-type region of photosensors of the first and second types.
申请公布号 US2016358969(A1) 申请公布日期 2016.12.08
申请号 US201514731707 申请日期 2015.06.05
申请人 OmniVision Technologies, Inc. 发明人 Fu Zhenhong;Yang Dajiang;Yi Xianmin;Chen Gang;Hu Sing-Chung;Mao Duli
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A front-side imaging (FSI) red-green-blue-infrared (RGB-IR) photosensor array comprising: a plurality of photosensors of a first type, where each photosensor of the first type comprises a diffused N-type region in a P-type well, the P-type well diffused into a high resistivity semiconductor layer; a plurality of photosensors of a second type, where each photosensor of the second type comprises a diffused N-type region in a P-type well, the P-type well diffused into the high resistivity semiconductor layer; a plurality of photosensors of a third type, where each photosensor of the third type comprises a diffused N-type region diffused into the high resistivity semiconductor layer; where the diffused N-type regions of the photosensors of the first type are diffused to a first depth; the diffused N-type regions of the photosensors of the second type are diffused to a second depth, the first and second depth being different; and where the P− type wells of the photosensors of the first type are diffused to a third depth; the P− wells of the photosensors of the second type are diffused to a fourth depth, the third and fourth depth being different.
地址 Santa Clara CA US