| 摘要 |
PROBLEM TO BE SOLVED: To provide a data transmission system test device that can accurately conduct testing by using time information. SOLUTION: A time information extract circuit 33 extracts time information TM' from a multiplexed clock signal Cm' received from an input terminal 31 and a time setting circuit 34 sets the clock of a clock circuit 27 by using the extracted time information TM'. Further, a clock synchronizing circuit 35 synchronizes a clock signal C generated by a clock signal generating circuit 26 with a clock signal component of the received multiplexed clock signal Cm'. A multiplexer circuit 32 multiplexes the time information TM' outputted from the clock circuit 27 with the clock signal C and outputs a multiplexed clock signal Cm to the output terminal 30. Thus, by interconnecting input terminals and output terminals of a plurality of test devices, pieces of time information of the test devices are synchronized with each other to accurately conduct testing by using the time information. |
