发明名称 METHOD AND APPARATUS FOR ADJUSTING CHARACTERISTICS OF ELECTRON SOURCE, AND METHOD FOR MANUFACTURING ELECTRON SOURCE
摘要 PURPOSE: Method and apparatus for adjusting characteristics of electron source, and method for manufacturing electron source are provided to enable the characteristics of a multi-electron source to be almost the same in a simple process by the use of properties peculiar to an electron-emitting device. CONSTITUTION: A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, the method comprising the step of: applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more times according to a characteristic of the electron-emitting device; wherein: the voltage for adjustment is selected from a plurality of voltages having discrete values according to the characteristic of the electron-emitting device; and a number of applying times of the pulse is determined according to the characteristic of the electron-emitting device and the selected voltage.
申请公布号 KR20030014129(A) 申请公布日期 2003.02.15
申请号 KR20020046281 申请日期 2002.08.06
申请人 CANON KABUSHIKI KAISHA 发明人 AOKI SHUJI;OGUCHI TAKAHIRO
分类号 G09G3/20;G09G3/22;H01J9/42;(IPC1-7):G09G3/20 主分类号 G09G3/20
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