发明名称 |
EXAMINATION APPARATUS USING ULTRASONIC WAVE |
摘要 |
PROBLEM TO BE SOLVED: To provide an examination apparatus using ultrasonic waves that permits a simple positioning of a probe and is capable of a highly reproducible examination. SOLUTION: A positioning member 5 is provided at the tip of a probe 3 sending and receiving ultrasonic waves. A positioning window 52 in which a translucent member 521 is mounted is provided adjacently to the tip of the probe 3, and a mark portion 522 is provided in the center of the translucent member 521. Pasting members 53 and 54 are provided in the surroundings of a hole 51 and the positioning window 52 on the examinee side of the positioning member 5.
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申请公布号 |
JP2003079622(A) |
申请公布日期 |
2003.03.18 |
申请号 |
JP20010280680 |
申请日期 |
2001.09.14 |
申请人 |
OMRON CORP |
发明人 |
KOBAYASHI TATSUYA;YAMAUCHI TAKANOBU;YAMADA SATOSHI |
分类号 |
G01B17/02;A61B5/06;A61B8/00;G01S15/88;(IPC1-7):A61B8/00 |
主分类号 |
G01B17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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