发明名称 |
Semi-automated multi-site system tester |
摘要 |
A processor chip is tested by placing it on a modified system motherboard within a system test station The modified motherboard is able to operate as a fully functional PC motherboard with an operating system and application software. A socket is provided to allow the easy addition and removal of processor chips under test The test program for testing a processor chip is exercised as an application program and monitors and reports status of the test to the system test controller A thermal unit with a built in temperature controller is coupled to the system motherboard as via an I/O connector. At the start of a test the thermal unit is brought into contact with the processor chip under test and the thermal unit either heats or cools the processor chip to maintain the processor chip case at a required test temperature The stations operate in a semi-automatic mode with an operator needed only to insert and extract processor chips and indicate a test ready condition The number of test stations is limited only by the networking capability of the test system configured for a particular manufacturing environment.
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申请公布号 |
US2003060996(A1) |
申请公布日期 |
2003.03.27 |
申请号 |
US20020201046 |
申请日期 |
2002.07.23 |
申请人 |
YI JOHN;MARQUIS TERRY;CHEN K.S.;ZHU ZHENG |
发明人 |
YI JOHN;MARQUIS TERRY;CHEN K.S.;ZHU ZHENG |
分类号 |
G01R31/317;G01R31/319;G06F11/24;(IPC1-7):G01M19/00;G06F19/00 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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