发明名称 MASK, EXPOSURE METHOD AND METHOD OF MANUFACTURING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an exposure method which can expose patterns of contact hole arrays having fine hole diameters or the patterns intermingled with the isolated contact holes and the contact hole arrays with high resolution without exchanging a mask and an apparatus for the same. <P>SOLUTION: The mask having the patterns to be transferred to a substrate have the first desired contact hole patterns, the first dummy contact hole patterns which are arrayed on the peripheries of the first desired contact hole patterns and have the hole diameters smaller than the hole diameters of the first desired contact hole patterns, the second desired contact hole patterns which are different in the hole diameters from the first desired contact hole patterns and the second dummy contact hole patterns which are arrayed on the peripheries of the second desired contact hole patterns and have the hole diameters smaller than the hole diameters of the second desired contact hole patterns. <P>COPYRIGHT: (C)2003,JPO</p>
申请公布号 JP2003233165(A) 申请公布日期 2003.08.22
申请号 JP20020035644 申请日期 2002.02.13
申请人 CANON INC 发明人 YAMAZOE KENJI;HASEGAWA MASANORI
分类号 G03F1/32;G03F1/68;G03F1/70;H01L21/027;(IPC1-7):G03F1/08 主分类号 G03F1/32
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