发明名称
摘要 <p>PURPOSE:To form a thin film on a wafer in a uniform thickness. CONSTITUTION:A recessed part 4 having an outer diameter slightly smaller than that of a wafer 2 is provided on the wafer receptive surface 3 of a susceptor 1 coaxially or practically coaxially with the surface 3. When the wafer is held by the susceptor, the entire periphery of the wafer is brought into contact with the surface 3 in the same width, and the heat is uniformly transmitted from the susceptor to the periphery of the wafer 2. Consequently, a wafer. is uniformly heated, when the susceptor is used in a semiconductor producing device to form a thin film on the wafer surface by the thermochemical reaction with a reactive gas.</p>
申请公布号 JP3453834(B2) 申请公布日期 2003.10.06
申请号 JP19940027772 申请日期 1994.02.25
申请人 发明人
分类号 C23C16/44;C23C16/455;C23C16/458;C23C16/46;H01L21/31;H01L21/68;H01L21/683;(IPC1-7):H01L21/31 主分类号 C23C16/44
代理机构 代理人
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