发明名称 |
PLASMA TREATING APPARATUS AND PLASMA TREATING METHOD |
摘要 |
PURPOSE: A plasma treating apparatus is provided to stabilize a process and to prevent reaction byproducts from being deposited on a part of the inner surface of a process chamber by stably etching a non-volatile material. CONSTITUTION: A process chamber(1) is prepared. A process gas introducing pipe(21) introduces process gas to the process chamber. A mounting electrode(5) mounts and maintains a sample, disposed in the process chamber. A RF(radio frequency) power(9,16) for generating a bias potential supplies the bias potential to the sample. An induction coil(12) supplies RF power and makes the process gas in plasma. A conductor member(18) supplies the bias potential to a part of the inner surface of the process chamber, installed in the process chamber. A trap member that has an adhesion surface of the reaction product is included in another part of the inner surface of the process chamber, capable of being detachably attached.
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申请公布号 |
KR20040019608(A) |
申请公布日期 |
2004.03.06 |
申请号 |
KR20020051204 |
申请日期 |
2002.08.28 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
EDAMURA MANABU;KANNO SEIICHIRO;YOSHIOKA KEN;NISHIO RYOJI;KANAI SABUROU;KANEKIYO TADAMITSU |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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