发明名称 PLASMA TREATING APPARATUS AND PLASMA TREATING METHOD
摘要 PURPOSE: A plasma treating apparatus is provided to stabilize a process and to prevent reaction byproducts from being deposited on a part of the inner surface of a process chamber by stably etching a non-volatile material. CONSTITUTION: A process chamber(1) is prepared. A process gas introducing pipe(21) introduces process gas to the process chamber. A mounting electrode(5) mounts and maintains a sample, disposed in the process chamber. A RF(radio frequency) power(9,16) for generating a bias potential supplies the bias potential to the sample. An induction coil(12) supplies RF power and makes the process gas in plasma. A conductor member(18) supplies the bias potential to a part of the inner surface of the process chamber, installed in the process chamber. A trap member that has an adhesion surface of the reaction product is included in another part of the inner surface of the process chamber, capable of being detachably attached.
申请公布号 KR20040019608(A) 申请公布日期 2004.03.06
申请号 KR20020051204 申请日期 2002.08.28
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 EDAMURA MANABU;KANNO SEIICHIRO;YOSHIOKA KEN;NISHIO RYOJI;KANAI SABUROU;KANEKIYO TADAMITSU
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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