| 发明名称 |
X-ray inspection apparatus and method |
| 摘要 |
An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.
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| 申请公布号 |
US6711235(B2) |
申请公布日期 |
2004.03.23 |
| 申请号 |
US20020161276 |
申请日期 |
2002.05.31 |
| 申请人 |
GENERAL ELECTRIC CORMPANY |
发明人 |
GALISH ANDREW JOSEPH;BIRDWELL THOMAS WILLIAM;ISAACS RALPH GERALD;LITTLE FRANCIS HOWARD |
| 分类号 |
G01N23/04;G21K1/02;G21K1/04;G21K5/02;(IPC1-7):G21K1/02 |
主分类号 |
G01N23/04 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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