发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device with its quality and reliability enhanced by reducing the region of a sealing resin 6 along the edges of a semiconductor element 2 for stress alleviation along the edges. <P>SOLUTION: The semiconductor device comprises a semiconductor device carrier 3 which is an insulating substrate having on its top surface a wiring pattern connected to a plurality of electrodes 4 and, on its bottom surface, external connection terminals 7 electrically connected to the electrodes 4 and to wirings; a semiconductor element 2 connected by a plurality of bump electrodes to the electrodes 4 on the top surface of the semiconductor device carrier 3; and a sealing resin 6 for filling and coating gaps between the semiconductor element 2 and the semiconductor device carrier 3, and for providing a coating along the edges of the semiconductor element 2. Of the sealing resin 6 coating the semiconductor device carrier 3 along the edges of the semiconductor element 2, the part coating one of the edges is cut off for the cross section of the sealing resin 6 to be roughly vertical to the surface of the semiconductor device carrier 3. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004119481(A) 申请公布日期 2004.04.15
申请号 JP20020277569 申请日期 2002.09.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NONOYAMA SHIGERU;AKABOSHI TOSHITAKA;NAKAOKA YUKIKO;KAWAKAMI YOSHIHIKO;ITO SEIICHI
分类号 H01L23/28;H01L21/56;H01L21/60;H01L23/12 主分类号 H01L23/28
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