发明名称 Semiconductor device and method for fabricating the same
摘要 The semiconductor device includes a MOSFET including a pair of impurity diffused regions formed on both sides of a gate formed on a semiconductor substrate; an insulation film covering a top of the MOSFET and having a through-hole opened on one of the impurity diffused regions formed in; and a capacitor formed at at least a part of an inside of the through-hole, the through-hole having a larger diameter inside than at a surface thereof or having a larger diameter at an intermediate part between the surface thereof and a bottom thereof than the surface and the bottom thereof.
申请公布号 US6730574(B2) 申请公布日期 2004.05.04
申请号 US20010975510 申请日期 2001.10.12
申请人 FUJITSU LIMITED 发明人 EMA TAIJI;ANEZAKI TOHRU;MITANI JUNICHI
分类号 H01L21/8242;(IPC1-7):H01L21/20;H01L21/824 主分类号 H01L21/8242
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