发明名称 Semiconductor device and method for producing the same
摘要 A gate electrode is formed on a substrate via a gate insulating film. The gate insulating film includes a high dielectric constant film containing a metal, oxygen and hydrogen, and a lower barrier film formed below the high dielectric constant film and containing a metal, oxygen, silicon and nitrogen.
申请公布号 US2004084736(A1) 申请公布日期 2004.05.06
申请号 US20030602724 申请日期 2003.06.25
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HARADA YOSHINAO
分类号 H01L21/28;H01L29/51;(IPC1-7):H01L21/823;H01L29/94 主分类号 H01L21/28
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