发明名称 POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN BY USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist composition and a method for forming a resist pattern by which the proximity effect can be decreased without decreasing the focal depth, and more preferably, the proximity effect can be decreased while the focal depth is increased. <P>SOLUTION: The resist composition contains a resin component (A) the alkali solubility of which increases by the effect of an acid, an acid generating agent component (B) which generates an acid by exposure, and an organic solvent (C). The component (A) contains: a structural unit (a1) containing an acid dissociable solubility suppressing group and derived from a (meth)acrylate; a structural unit (a2) containing an acid dissociable solubility suppressing group which is less dissociable than the acid dissociable solubility suppressing group included in the structural unit (a1), and derived from a (meth)acrylate; and a structural unit (a3) containing a lactone functional group and derived from a (meth)acrylate. The method for forming a resist pattern is carried out by using the above composition. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005037893(A) 申请公布日期 2005.02.10
申请号 JP20040119498 申请日期 2004.04.14
申请人 TOKYO OHKA KOGYO CO LTD 发明人 HAYASHI RYOTARO;TAKESHITA MASARU;IWAI TAKESHI
分类号 G03F7/039;C08F220/18;G03F7/033;H01L21/027 主分类号 G03F7/039
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