发明名称 Method and apparatus for picking up a semiconductor chip, method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape
摘要 A method and apparatus for picking up a semiconductor chip, a method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape are provided. Air may be blown through air holes in a dicing tape to at least partially separate the semiconductor chip from the dicing tape and/or create a space between the semiconductor chip to weaken the adhesion of the dicing tape to the semiconductor chip. The semiconductor chip may then be picked up by a removal member and completely removed from the dicing tape. Semiconductor chips that are not to be removed may be vacuum-suctioned to the dicing tape. UV radiation or heat may be applied to weaken the adhesion of the dicing tape. The semiconductor chip may be detected by an optical detector. Removing the semiconductor chips by air reduces stress and damage to the semiconductor chips.
申请公布号 US6869264(B2) 申请公布日期 2005.03.22
申请号 US20030435202 申请日期 2003.05.12
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 YOO CHEOL-JOON
分类号 H01L21/50;H01L21/00;H01L21/68;(IPC1-7):B65B21/02 主分类号 H01L21/50
代理机构 代理人
主权项
地址