发明名称 Multilevel contact to a 3D memory array and method of making thereof
摘要 A multi-level device includes at least one device region and at least one contact region. The contact region has a stack of alternating plurality of electrically conductive layers and plurality of electrically insulating layers located over a substrate. The plurality of electrically conductive layers form a stepped pattern in the contact region, where each respective electrically insulating layer includes a sidewall and a respective underlying electrically conductive layer in the stack extends laterally beyond the sidewall. Optionally, a plurality of electrically conductive via connections can be formed, which have top surfaces within a same horizontal plane, have bottom surfaces contacting a respective electrically conductive layer located at different levels, and are isolated from one another by at least one trench isolation structure.
申请公布号 US9515023(B2) 申请公布日期 2016.12.06
申请号 US201514643211 申请日期 2015.03.10
申请人 SANDISK TECHNOLOGIES LLC 发明人 Tobitsuka Toshihide;Takaki Seje
分类号 H01L23/535;H01L21/768;H01L27/115;H01L27/24 主分类号 H01L23/535
代理机构 The Marbury Law Group PLLC 代理人 The Marbury Law Group PLLC
主权项 1. A method of fabricating a multilevel structure, comprising: forming a stack including an alternating plurality of electrically conductive layers and electrically insulating layers over a substrate; forming a recessed region through the stack, wherein top surfaces of a first set of electrically conductive layers located at different levels are physically exposed within the recessed region; forming a first electrically conductive spacer directly on the top surfaces of the first set of electrically conductive layers within the recessed region; and forming at least one trench isolation structure extending through the stack, wherein the at least one trench isolation structure divides the first electrically conductive spacer into a plurality of electrically conductive via connections.
地址 Plano TX US