发明名称 Semiconductor integrated circuit having two switch transistors formed between two diffusion-layer lines
摘要 A multi-storage nonvolatile memory of high density, high speed and high reliability has a memory transistor and switch transistors disposed on both the sides of the memory transistor. The memory transistor includes a gate insulating film having discrete traps and a memory gate electrode, whereas the switch transistors include switch gate electrodes. The gate insulating film has the discrete traps for storing information charge, can locally inject carriers, and one memory cell constitutes a multi-storage cell for storing at least information of 2 bits. The switch transistors having the switch gate electrodes realize source side injection. The memory transistor is fommed together with the switch transistors in self-aligned diffusion. The memory gate electrode of the memory transistor is connected to a word line so as to perform word-line erase.
申请公布号 US6894344(B2) 申请公布日期 2005.05.17
申请号 US20030663779 申请日期 2003.09.17
申请人 RENESAS TECHNOLOGY CORP. 发明人 KAMIGAKI YOSHIAKI;MINAMI SHINICHI;KATAYAMA KOZO;KATO MASATAKA
分类号 G11C11/56;G11C16/02;G11C16/04;H01L21/28;H01L21/336;H01L21/8246;H01L21/8247;H01L27/02;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/792 主分类号 G11C11/56
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