发明名称 Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
摘要 Amount of coating cure or contamination is determined. An infrared beam is transmitted into a crystal. The beam reflects off an internal face at an angle higher than critical reflection angle to generate total reflection at the crystal face. The beam exits the crystal, is filtered at two wavelengths, and is detected to give values I<SUB>o1 </SUB>and I<SUB>o2 </SUB>of infrared energy reflected without coating. A coated sample contacts an outside face of the crystal. An evanescent wave penetrates the sample where the beam reflects from internal crystal face. The beam is partially absorbed by sample, exits the crystal, is filtered at two wavelengths, and is detected to give values I<SUB>c1 </SUB>and I<SUB>c2 </SUB>of infrared energy reflected with coating. Absorbance values A 1 and A 2 at two wavelengths are A 1 =-log<SUB>10</SUB>(I<SUB>c1</SUB>/I<SUB>o1</SUB>) and A 2 =-log<SUB>10</SUB>(I<SUB>c2</SUB>/I<SUB>o2</SUB>). Amount of cure or contamination is proportional to ratio or difference between A 1 and A 2.
申请公布号 US6906327(B2) 申请公布日期 2005.06.14
申请号 US20020304627 申请日期 2002.11.26
申请人 THE BOEING COMPANY 发明人 SHELLEY PAUL H.;LARIVIERE DIANE R.
分类号 G01N21/31;G01N21/35;G01N21/55;G01N21/84;(IPC1-7):G01J5/02 主分类号 G01N21/31
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