发明名称 Method of fabricating a random access memory device utilizing a vertically oriented select transistor
摘要 A memory structure has a vertically oriented access transistor with an annular gate region. A transistor is fabricated such that the channel of the transistor extends outward with respect to the surface of the substrate. An annular gate is fabricated around the vertical channel such that it partially or completely surrounds the channel. A buried annular bitline may also be implemented. After the vertically oriented transistor is fabricated with the annular gate, a storage device may be fabricated over the transistor to provide a memory cell.
申请公布号 US6951789(B2) 申请公布日期 2005.10.04
申请号 US20040878059 申请日期 2004.06.29
申请人 MICRON TECHNOLOGY, INC. 发明人 VOSHELL THOMAS W.;BISSEY LUCIEN J.;DUESMAN KEVIN G.
分类号 G11C11/24;G11C11/404;H01L21/336;H01L21/8242;H01L27/02;H01L27/108;H01L29/423;H01L29/76;H01L29/78;(IPC1-7):H01L21/824 主分类号 G11C11/24
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