发明名称 Test device, test method, and program
摘要 When static electrical charge by electromagnetic waves is applied to a test-target board or test noises are applied to the ground of the test-target board, a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board, and a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board together with the number of conductions.
申请公布号 US9453868(B2) 申请公布日期 2016.09.27
申请号 US201214372101 申请日期 2012.03.23
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 Kimata Hiroyuki;Ishizaka Satoru
分类号 G01R31/02;G01R31/00;G01R31/28 主分类号 G01R31/02
代理机构 Buchanan Ingersoll & Rooney PC 代理人 Buchanan Ingersoll & Rooney PC
主权项 1. A test device comprising: an isolator which receives, through electromagnetic induction, noises applied to a test-target circuit and conducting through a path on the circuit, and which is provided on a separate board from a board on which the test-target circuit is formed; and a noise detector which detects a conduction of the noises through the path when the isolator receives the noises, and which is provided on the separate board.
地址 Chiyoda-Ku, Tokyo JP