发明名称 |
Test device, test method, and program |
摘要 |
When static electrical charge by electromagnetic waves is applied to a test-target board or test noises are applied to the ground of the test-target board, a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board, and a test device tests as to whether or not noises are conducted through a path from an OUT terminal of an amplifier circuit to the ground of the test-target board together with the number of conductions. |
申请公布号 |
US9453868(B2) |
申请公布日期 |
2016.09.27 |
申请号 |
US201214372101 |
申请日期 |
2012.03.23 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
Kimata Hiroyuki;Ishizaka Satoru |
分类号 |
G01R31/02;G01R31/00;G01R31/28 |
主分类号 |
G01R31/02 |
代理机构 |
Buchanan Ingersoll & Rooney PC |
代理人 |
Buchanan Ingersoll & Rooney PC |
主权项 |
1. A test device comprising:
an isolator which receives, through electromagnetic induction, noises applied to a test-target circuit and conducting through a path on the circuit, and which is provided on a separate board from a board on which the test-target circuit is formed; and a noise detector which detects a conduction of the noises through the path when the isolator receives the noises, and which is provided on the separate board. |
地址 |
Chiyoda-Ku, Tokyo JP |