发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME, AND POWER CONVERSION DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To avoid increase in contact resistance of an ohmic electrode caused by etching, in a semiconductor device.SOLUTION: A method of manufacturing a semiconductor device includes the following steps of: forming a semiconductor layer; forming an ohmic electrode obtained by laminating a plurality of metal layers, on the semiconductor layer; forming another metal layer mainly formed of other metal of a different kind from a material of the outermost layer in the plurality of metal layers, on the ohmic electrode; removing the other metal layer from an upper part of the ohmic electrode by etching; and performing heat treatment to the ohmic electrode after etching.SELECTED DRAWING: Figure 3 |
申请公布号 |
JP2016174067(A) |
申请公布日期 |
2016.09.29 |
申请号 |
JP20150053019 |
申请日期 |
2015.03.17 |
申请人 |
TOYODA GOSEI CO LTD |
发明人 |
INA TSUTOMU;OKA TORU;TANAKA SHIGEAKI |
分类号 |
H01L21/28;H01L21/336;H01L21/338;H01L29/12;H01L29/417;H01L29/778;H01L29/78;H01L29/812 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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