发明名称 |
System and method for test structure on a wafer |
摘要 |
System and method for test structure on a wafer. According to an embodiment, the present invention provides a test structure for testing an integrated circuit. For example, the test structure and the integrated circuit are manufactured on a same substrate material and the testing being conducted is in a temperature-controlled environment. The test structure includes a top structure positioned above the integrated circuit, the top structure including a first metal material, which includes a first electrical terminal and a second electrical terminal. The test structure also includes a bottom structure positioned below the integrated circuit, the bottom structure including a first silicon material. A first side structure is positioned between the top structure and the bottom structure and located next to a first side of the integrated circuit. A second side structure is positioned between the top structure and the bottom structure and located next to a second side of the integrated circuit. |
申请公布号 |
US9472476(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201313801251 |
申请日期 |
2013.03.13 |
申请人 |
Semiconductor Manufacturing International (Shanghai) Corporation |
发明人 |
Ping Wang Jian;Liao Chin Chang;Wong Waisum |
分类号 |
H01L21/66;G01R31/28 |
主分类号 |
H01L21/66 |
代理机构 |
Kilpatrick Townsend & Stockton LLP |
代理人 |
Kilpatrick Townsend & Stockton LLP |
主权项 |
1. A test structure for testing an integrated circuit, wherein the test structure and the integrated circuit are manufactured on a same substrate material and the testing being conducted is in a temperature-controlled environment, the test structure comprising:
a top structure positioned above the integrated circuit, the top structure configured to generate heat and including a first metal material, the first metal material including a first electrical terminal and a second electrical terminal; a bottom structure positioned below the integrated circuit, the bottom structure including a first silicon material; a first side structure positioned between the top structure and the bottom structure and located next to a first side of the integrated circuit, the first side structure being characterized by a first height, the first side structure including a second metal material; a second side structure positioned between the top structure and the bottom structure and located next to a second side of the integrated circuit, the second side structure being characterized by a second height, the second side structure including a third metal material, wherein the top structure is not electrically connected to the first and second side structures. |
地址 |
Shanghai CN |