发明名称 Plasma treatment esp. of semiconductor substrates - which rest on a temp. controlled plate in the treatment chamber
摘要 <p>Plasma treatment or etching is employed to remove material from a substrate resting on a plate (I) during a plasma discharge. (I) can be cooled and/or heated, and is in thermal contact with the substrates so their temp. can be controlled during the process. (I) pref. contains a pipe through which a heating or cooling fluid can flow; and is pref. made of the same material as the perforated tunnel used for plasma attack, e.g. Al. Used in the mfr. of semiconductors, for etching substrates and/or for removing layers of photoresist from their surfaces. The temp. of the substrates before and during etching is effectively controlled.</p>
申请公布号 FR2372571(A1) 申请公布日期 1978.06.23
申请号 FR19770034884 申请日期 1977.11.21
申请人 SIEMENS AG 发明人
分类号 C23F4/00;H01J37/34;H01L21/00;H01L21/302;H01L21/3065;(IPC1-7):05H1/04;01L21/34 主分类号 C23F4/00
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