发明名称 Method and system for computer assisted hot-tracing mechanism
摘要 This invention provides a new mechanism for “Hot-Tracing” using a novel placeholder mechanism and binary rewriting techniques, which leverages existing compiler flags in order to enable light-weight and highly flexible dynamic instrumentation. Broadly, I-Probe can be divided in 2 distinct workflows—1. Pre-processing (ColdPatch), and 2. Hot Tracing. The first phase is a pre-processing mechanism to prepare the binary for phase 2. The second phase is the actual hot-tracing mechanism, which allows users to dynamically instrument functions (more specifically symbols) of their choice.
申请公布号 US9489286(B2) 申请公布日期 2016.11.08
申请号 US201414168375 申请日期 2014.01.30
申请人 NEC Corporation 发明人 Arora Nipun;Zhang Hui;Rhee Junghwan;Jiang Guofei;Yoshihira Kenji
分类号 G06F9/44;G06F11/36 主分类号 G06F9/44
代理机构 代理人 Kolodka Joseph
主权项 1. A computer implemented method for monitoring systems for misconfigurations difficult to detect, the method comprising: employing a cold patch preprocess using a processor for preparing a target application for hot tracing, the target application having at least one library, the cold patch preprocess including using compiler flags to generate calls to symbols and adding NOPs in place of all the calls to symbols except those that need to be cold started; executing the preprocessed target application resulting in a run time of the preprocessed target application; interrupting the run time of the preprocessed target application; implementing instrumentation or de-instrumentation during the interrupted run time of the preprocessed target application enabled by the hot tracing; replacing selected ones of the NOPs with calls to instrumentation depending on functions which a user wishes to instrument; preloading the instrumentation in the form of a shared library before start of execution of the preprocessed target application, generating a list of offsets that act as the placeholders for the hot tracing; and providing interactive graphical user interfaces for the cold patch and the hot tracing, wherein the hot tracing enables users to dynamically instrument functions in the system for monitoring for misconfigurations.
地址 JP