发明名称 METHOD AND APPARATUS FOR SENSING INPLANE DEFORMATION OF A SURFACE
摘要 <p>A surface on which there is a regular periodic pattern, often a relief pattern (12), is deformed, and in-plane deformation is sensed by illuminating the deformed pattern with a beam (12) of coherent light so that light is reflected as one zero order beam and a plurality of diffracted beams, and combining two of the beams (16, 18) so that they interfere in a manner related to the deformation along the direction of intersection of the surface plane with the plane in which the two interfering beams lie. The magnitude and direction of in-plane deformation in one or more directions and the magnitude and direction of the maximum in-plane stress or strain, can be determined automatically.</p>
申请公布号 GB2008791(A) 申请公布日期 1979.06.06
申请号 GB19780046064 申请日期 1978.11.24
申请人 MCKELVIE J;WALKER C A 发明人
分类号 G01B9/02;G01B11/16;(IPC1-7):02B27/38 主分类号 G01B9/02
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