发明名称 Semiconductor with capacity reducing region - in pt. of pn-junction under contact zone to avoid impaired frequency characteristics
摘要 <p>Semiconductor device with pn-junction(s) has a contact to one of the semiconductor zones froming the junction through a contact zone, which is lower ohmic than the semiconductor zone to be contacted. Below this contact zone, there is a region reducing the capacity of the pt. of the pn-junction under the contact zone or ensuring that there is no pn-junction in the region below the contact zone.</p>
申请公布号 DE2822911(A1) 申请公布日期 1979.11.29
申请号 DE19782822911 申请日期 1978.05.26
申请人 BENEKING,HEINZ,PROF.DR.RER.NAT. 发明人 BENEKING,HEINZ,PROF.DR.RER.NAT.
分类号 H01L21/265;H01L29/06;H01L29/36;H01L29/423;H01L29/732;(IPC1-7):01L29/86;01L21/28;01L29/72 主分类号 H01L21/265
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