发明名称 |
Semiconductor with capacity reducing region - in pt. of pn-junction under contact zone to avoid impaired frequency characteristics |
摘要 |
<p>Semiconductor device with pn-junction(s) has a contact to one of the semiconductor zones froming the junction through a contact zone, which is lower ohmic than the semiconductor zone to be contacted. Below this contact zone, there is a region reducing the capacity of the pt. of the pn-junction under the contact zone or ensuring that there is no pn-junction in the region below the contact zone.</p> |
申请公布号 |
DE2822911(A1) |
申请公布日期 |
1979.11.29 |
申请号 |
DE19782822911 |
申请日期 |
1978.05.26 |
申请人 |
BENEKING,HEINZ,PROF.DR.RER.NAT. |
发明人 |
BENEKING,HEINZ,PROF.DR.RER.NAT. |
分类号 |
H01L21/265;H01L29/06;H01L29/36;H01L29/423;H01L29/732;(IPC1-7):01L29/86;01L21/28;01L29/72 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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