FLAW DETECTING PROBE FOR NONNDESTRUCTIVE INSPECTION,申请号JP19780157411-传众专利搜索

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发明名称	FLAW DETECTING PROBE FOR NONNDESTRUCTIVE INSPECTION
摘要
申请公布号	JPS5585248(A)	申请公布日期	1980.06.27
申请号	JP19780157411	申请日期	1978.12.22
申请人	HITACHI LTD	发明人	SONOBE YUKIO;TAKAHASHI ISAO;KINO HIROTOSHI
分类号	G01N27/82;G01N29/04	主分类号	G01N27/82
代理机构		代理人
主权项
地址

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