发明名称 |
Calibrated temperature measurement system |
摘要 |
In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may comprise resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio and the resistor-characterization information. |
申请公布号 |
US9470585(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201313904743 |
申请日期 |
2013.05.29 |
申请人 |
Intel IP Corporation |
发明人 |
Hong Merit;Harnishfeger David;Kaufman Kris |
分类号 |
G01K7/00;G01K15/00;G01K7/22;G01K7/16;G01R19/25 |
主分类号 |
G01K7/00 |
代理机构 |
Baker Botts L.L.P. |
代理人 |
Baker Botts L.L.P. |
主权项 |
1. A temperature measurement system, comprising:
a resistor; a thermistor; a resistance-to-current converter configured to generate a current signal based on a resistance of one of the resistor and the thermistor; an analog-to-digital converter (ADC) configured to:
receive a first current signal based on the resistor;convert the first current signal into a first digital signal;receive a second current signal based on the thermistor; andconvert the second current signal into a second digital signal; a memory comprising resistor-characterization information; and a calculation stage communicatively coupled to an ADC output and configured to:
determine a first digital value based on the first digital signal;determine a second digital value based on the second digital signal; anddetermine a temperature output value based on the first digital value, the second digital value, and the resistor-characterization information. |
地址 |
Santa Clara CA US |