发明名称 Formation of multilayer dopant distributions in a semiconductor
摘要 A method of making solid state devices having multilayer dopant distributions, including p-p+ and n-n+ junctions, etc. A semiconductor body is rapidly melted, typically by a laser, electron beam, or ion beam. Present in the melt is a first dopant having a low segregation coefficient and a second dopant having a high segregation coefficient. During rapid resolidification of the melt, the first dopant segregates toward the surface, while the second dopant remains substantially in place, producing a junction. The production of diodes, bipolar and field effect transistors, Schottky barriers, ohmic contacts, junction isolated surface regions, high conductivity paths, etc., is possible by this method.
申请公布号 US4364778(A) 申请公布日期 1982.12.21
申请号 US19800154855 申请日期 1980.05.30
申请人 BELL TELEPHONE LABORATORIES, INCORPORATED 发明人 LEAMY, HARRY J.;SEIDEL, THOMAS E.
分类号 H01L21/228;(IPC1-7):H01L7/34;H01L21/26 主分类号 H01L21/228
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