发明名称 Measurement instruments with multiple operation levels.
摘要 <p>A measurement instrument has a plurality of operation levels with different respective sets of operational functions associated therewith. Each operational function has at least two independently selectable characteristics related thereto. When an operation level of the instrument is selected, the instrument displays the characteristics related to the or each operational function associated with the selected operation level, and the operator is able to select one characteristic relates to the or each operational function associated with the operation level. The characteristics related to at least one of the operational functions may each have a single value, e.g. relating to a mode of operation of the instrument. If one of the characteristics has a range of values, a value of that characteristic may be selected within the range.</p>
申请公布号 EP0123118(A1) 申请公布日期 1984.10.31
申请号 EP19840102948 申请日期 1984.03.16
申请人 TEKTRONIX, INC. 发明人 BLATTNER, JOHN D.;MOSER, DAVID B.;DELEGANES, SAM M.
分类号 G01R13/28;G01R13/20;G06F3/02;G06F3/048;G06F3/14;(IPC1-7):01R13/20;09G1/16 主分类号 G01R13/28
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