| 摘要 |
<p>An integrated circuit device comprises a data processing unit (CPU) (1), a first read only memory (ROM) (5) storing an applications program to be executed in the CPU, a second ROM (6) having an address space which is addressed in common with the first ROM and storing a test program for a function diagnosis, and a test control unit (14). The test control unit is responsive to a test control signal (TEST) externally applied in a test mode to couple the second ROM to the CPU so that the test program for setting an initial condition is executed. During the execution of the test program, the first ROM is coupled to the CPU, thereby executing applications program instructions the contents and the number of which are externally designated. Thereafter, the second ROM is coupled to the CPU so as to execute the test program for deciding a test complete condition. The execution result of the applications program instructions are compared with expected values to decide if the integrated circuit device functions normally. The address space of first and second ROMs is expanded in a software manner, and the address space of the first ROM can be assigned only to the applications program.</p> |
