发明名称 Device for measuring thermal characteristics of a material sample
摘要 The invention relates to a device for measuring thermal characteristics of a material sample, which contains a pulse operation heat source, a frame which accommodates the material sample to be measured, a measuring unit tuned to the material sample to be measured, and an electronic ciruit which evaluates the measurement results. The essence of the invention resides in the fact that the measuring unit has two measuring sensors (K1, K2) which are constructed with needle-shaped ends, consist of different metals, are supported against the material sample (M) and thereby or by means of an electrically conductive path constructed thereon together form a thermocouple, and that the electronic circuit is provided with a pre-amplifier (E) which is connected to the measuring sensors (K1, K2) and detects their voltage, the measuring sensors (K1, K2) being pressed against the surface of the material sample (M). The simple construction is particularly favourable in industrial applications, although the high measurement accuracy also allows it to be used in research and science. <IMAGE>
申请公布号 DE3425561(A1) 申请公布日期 1985.01.31
申请号 DE19843425561 申请日期 1984.07.11
申请人 BUDAPESTI MUESZAKI EGYETEM 发明人 FALUDI,ARPAD,DIPL.EL-ING.;BENKO,IMRE,DIPL.-MASCH.-ING.DR.;KISS,LASZLO,DIPL.-MASCH.-ING.;GROF,GYULA,DIPL.-MASCH.-ING.;BOLYO,LASZLO
分类号 G01K17/00;G01N25/48;(IPC1-7):G01N25/00 主分类号 G01K17/00
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