| 摘要 |
A testing method and device for soldering of a power amplifier transistor in a power amplifier. The testing method comprises: acquiring a serial number of a power amplifier (S10); configuring a signal parameter, generating a preset signal according to the signal parameter, and transmitting the preset signal to the power amplifier so as to enable the power amplifier to amplify the preset signal (S20); receiving an amplification signal output by the power amplifier (S30); processing the amplification signal to output frequency spectrum data (S40); and testing, according to the frequency spectrum data, a soldering condition of a power amplifier transistor in the power amplifier, and storing the test result in association with the corresponding serial number (S50). |
