主权项 |
1. An integrated circuit, comprising:
(a) test access port circuitry having a TDI input lead, a TMS input lead, a TCK input lead, a TDO output lead, a trace data output, a trace data input, and a trace control output; (b) trace domain circuitry having trace control inputs, a trace clock input, and a trace data output; and (c) controller circuitry having a TMS/TDI input lead, a clock input lead, and a TDO input lead, the controller circuitry being connected to:
i. the test access port circuitry by a TDI output lead coupled to the TDI input lead, a TMS output lead coupled to the TMS input lead, a TCK output lead coupled to the TCK input lead, and a TDO input lead coupled to the TDO output lead of the test access port circuitry; andii. the trace domain circuitry by trace control outputs coupled to the trace control inputs, a trace clock output coupled to the trace clock input, and a trace data input coupled to the trace data output; and (d) the controller circuitry including:
(i) serial input parallel output circuitry having a serial input connected to the TMS/TDI input lead, a clock input connected with the clock input lead, a TDI output, and a TMS output;(ii) a TDI update register having an input connected to the TDI output of the serial input parallel output circuitry and an output connected to the TDI output lead; and(iii) a TMS update register having an input connected to the TMS output of the serial input parallel output circuitry and an output connected to the TMS output lead. |