Method for measuring potential induced degradation of at least one solar cell or of a photovoltaic panel as well as the use of same method in the production of solar cells and photovoltaic panels

摘要

The invention relates to a method for measuring the high-voltage induced degradation (PID) of at least one solar cell. According to the invention, a conductive plastic material is pressed on the upper side or bottom side of the respective solar cell, in particular on the front side thereof, and a DC voltage greater than 50 V is applied between the plastic material and the respective solar cell. Alternatively, corona discharges may be applied to solar cells or photovoltaic modules. In one embodiment, a characteristic electric parameter of the respective solar cell or of the photovoltaic module is repeatedly measured at time intervals. The method according to the invention can be carried out on individual solar cells, which can be further processed directly after passing the test and without further complex processing, e.g. to a photovoltaic module. In principle, the method is also suitable for measurements on complete photovoltaic modules.

主权项

1. A method for measuring the high-voltage degradation (PID) of at least one solar cell or of a photovoltaic module, wherein
a conductive plastic material is pressed on the front side of the respective solar cell or photovoltaic module, and a voltage is applied between the conductive plastic material and the respective solar cell or the array of solar cells in the photovoltaic module; in which method at least one characteristic electric parameter of the respective solar cell or of the photovoltaic module is repeatedly measured in time intervals for measurement of the high-voltage degradation, wherein the characteristic electric parameter is a voltage-current characteristic curve (UI) or a shunt resistance (Rshunt) of the respective solar cell.