发明名称 |
CMOS INPUT PROTECTION CIRCUIT |
摘要 |
The circuit is for preventing the latch-up and increasing the break- down voltage of the gate insulation layer caused by the electrostatic discharge when the surge voltage (VDD) is less than the threshold voltage (VFTN) of a N-type field transistor (FTN), the polysilicon resistors (R1, R2) limits the current and a clamping diode (D1) passes the current to a power supply terminal (32). When the surge voltage is greater than the (VFTN), the current (VIN-VDD) is bypassed to the substrate so that the protection from the surge voltage is performed.
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申请公布号 |
KR890004426(B1) |
申请公布日期 |
1989.11.03 |
申请号 |
KR19860009885 |
申请日期 |
1986.11.22 |
申请人 |
SAMSUNG ELECTRONICS CO.LTD. |
发明人 |
JANG DUG-SU;KANG DONG-WOOK |
分类号 |
H01L29/74;(IPC1-7):H01L29/74 |
主分类号 |
H01L29/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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