发明名称 CMOS INPUT PROTECTION CIRCUIT
摘要 The circuit is for preventing the latch-up and increasing the break- down voltage of the gate insulation layer caused by the electrostatic discharge when the surge voltage (VDD) is less than the threshold voltage (VFTN) of a N-type field transistor (FTN), the polysilicon resistors (R1, R2) limits the current and a clamping diode (D1) passes the current to a power supply terminal (32). When the surge voltage is greater than the (VFTN), the current (VIN-VDD) is bypassed to the substrate so that the protection from the surge voltage is performed.
申请公布号 KR890004426(B1) 申请公布日期 1989.11.03
申请号 KR19860009885 申请日期 1986.11.22
申请人 SAMSUNG ELECTRONICS CO.LTD. 发明人 JANG DUG-SU;KANG DONG-WOOK
分类号 H01L29/74;(IPC1-7):H01L29/74 主分类号 H01L29/74
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