| 摘要 |
<p>A device for measuring the parameters of developing surface cracks comprises a sensitive element (1) applied to a dielectric sublayer (2) at the point of expected development of a surface crack (11) and comprised of a number of conductors (4', 4'', ... 4n), and further comprises a measuring circuit (3) electrically connected to the sensitive element (1) in which the ends of the conductors (4', 4'', ... 4n) are electrically interconnected in series by their main bridges (5', 5'', ... 5n-1), the sensitive element being also provided with additional bridges (6', 6'', ... 6n-1) each of which is located opposite a main bridge (5', 5'', ... 5n-1).</p> |
