| 摘要 |
An apparatus for connecting an integrated circuit, IC, device to a test system has a first circuit board on which the IC device is mounted. The circuit board has an analog transmission line interposed between and electrically isolated from digital transmission lines on opposed surfaces of the circuit board. The first circuit board is electrically connected to a second circuit board via coaxial probe assemblies disposed within apertures formed in a frame member mounted on the second circuit board. Each coaxial probe assembly has a connector disposed within one end of the aperture and a coaxial probe disposed with the other end. The connector and the probe head each have a cylindrical outer conductor electrically isolated from a central conductor. The cylindrical conductor and the central conductor of the connector are electrically connected to conductive runs on the second circuit board. The coaxial probe is mechanically connected to the connector and the outer conductor and the central conductor are electrically connected to the respective outer and central conductors of the connector.
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