发明名称 Surface measuring method and apparatus
摘要 A surface measuring method and apparatus utilizes a low energy neutral particle (neutral atom, neutral molecule) controlled to be equal to or lower than 1 eV, which is caused to collide against the surface of a specimen. A neutral particle reflected at the specimen surface is detected, and its energy is measured to non-destructively measure the chemical bonding state of the specimen surface.
申请公布号 US5115130(A) 申请公布日期 1992.05.19
申请号 US19900536152 申请日期 1990.06.07
申请人 HITACHI, LTD. 发明人 SUZUKI, KEIZO;NINOMIYA, KEN;YUNOGAMI, TAKASHI
分类号 H01J49/44;G01N23/20;H05H3/02 主分类号 H01J49/44
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