发明名称 METHOD OF FORMING BUFFER LAYER AND COMPOUND SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a superlattice by the molecular beam epitaxial method by substrate rotation and make the distribution of the substance on the surface uniform. CONSTITUTION:This is one example of HEMT being manufactured by MBE method. This HEMT has contact layers 117 and 118 consisting of Inlays, a doping layer 115 consisting of InAlAs, a buffer layer 113, a channel layer 114 consisting of InGaAs, and a superlattice buffer layer 112 consisting of AlAs/ InAs, on a semiconductor substrate 111, and further a source electrode 117, a drain electrode 18, and a gate electrode 119 are made. The buffer layer 113 is a mixed crystal layer (InAlAs) consisting of a substance (AlAs, InAs), which constitutes the superlattice of the superlattice buffer layer 112, so this HEMT has a feature in this point.
申请公布号 JPH0513329(A) 申请公布日期 1993.01.22
申请号 JP19910161793 申请日期 1991.07.02
申请人 SUMITOMO ELECTRIC IND LTD 发明人 NISHIYAMA NAOKI
分类号 H01L21/20;H01L21/203;H01L21/338;H01L29/06;H01L29/15;H01L29/778;H01L29/812 主分类号 H01L21/20
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