发明名称 TESTING DEVICES AND METHOD OF LCD ELECTRODE
摘要 The apparatus checks short or disconnection of a transparent electrode of indium tin oxide (ITO) formed on a trasparent glass board in manufacturing LCD panels. The method comprises supplying constant voltage to ITO transparent electrode (B) patterned on glass board (A) via flat conductor (9), arranging a plurality of coupled exclusive logic measuring bodies (3) with two probes at respective electrodes (B), scanning the bodies (3) sequentially and deciding short or disconnection by measuring voltage difference between first and second probes (1)(2) of the bodies (3).
申请公布号 KR930003672(B1) 申请公布日期 1993.05.08
申请号 KR19900014935 申请日期 1990.09.20
申请人 SAMSUNG ELECTRON DEVICES CO., LTD. 发明人 KIM, BYONG - HUI
分类号 G02F1/13;(IPC1-7):G02F1/13 主分类号 G02F1/13
代理机构 代理人
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