发明名称 Semiconductor device
摘要 A semiconductor device includes a semiconductor structure, a plurality of gate structures, at least one source/drain structure, at least one trench, a dielectric pattern, and a conductive structure. The gate structures are disposed on the semiconductor structure. The source/drain structure is disposed between two adjacent gate structures. The trench is disposed between the two adjacent gate structures and corresponding to the source/drain structure. The dielectric pattern is disposed on sidewalls of the trench. The conductive structure is disposed in the trench and electrically connected to the source/drain structure. The conductive structure includes a first portion surrounded by the dielectric pattern and a second portion connected to the source/drain structure, and the first portion is disposed on the second portion. A width of the first portion is smaller than a width of the second portion.
申请公布号 US9496176(B1) 申请公布日期 2016.11.15
申请号 US201615176142 申请日期 2016.06.07
申请人 UNITED MICROELECTRONICS CORP. 发明人 Tung Yu-Cheng;Liou En-Chiuan
分类号 H01L21/768;H01L29/417;H01L29/78;H01L29/66 主分类号 H01L21/768
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor device, comprising: a semiconductor structure; a plurality of gate structures disposed on the semiconductor structure, at least one source/drain structure disposed between two adjacent gate structures; at least one trench disposed between the two adjacent gate structures and corresponding to the source/drain structure; a dielectric pattern disposed on sidewalls of the trench; and a conductive structure disposed in the trench and electrically connected to the source/drain structure, wherein the conductive structure comprises an first portion surrounded by the dielectric pattern and a second portion connected to the source/drain structure, and the first portion is disposed on the second portion, wherein a width of the first portion is smaller than a width of the second portion.
地址 Hsin-Chu TW