发明名称 Method of fabricating an offset dual gate thin film field effect transistor
摘要 A method of fabricating an offset dual gate thin film field offset transistor wherein a lower gate electrode is formed on an insulating substrate is provided. A dielectric layer deposited. A polycrystalline silicon layer deposited and patterned to overlie and extend beyond the edges of the lower gate. A dielectric layer deposited. A metal layer deposited. A photoresist layer deposited and patterned to define a upper gate electrode in the metal layer that overlies the lower gate electrode but extend beyond one edge. The exposed metal layer is removed to form the upper gate electrode. An impurity is ion implanted into the polycrystalline silicon layer to form source and drain regions, using the photoresist layer and metal layer as a mask.
申请公布号 US5266507(A) 申请公布日期 1993.11.30
申请号 US19920884773 申请日期 1992.05.18
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 WU, NENG-WEI
分类号 H01L21/336;H01L27/11;H01L29/786;(IPC1-7):H01L21/336;H01L21/28;H01L29/78 主分类号 H01L21/336
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