发明名称 Method of making a semiconductor memory device
摘要 A semiconductor substrate according to the present invention includes a first semiconductor substrate of a first conductivity type, an insulating film selectively formed in the first semiconductor substrate to define an exposed surface region, and a second semiconductor substrate of a second conductivity type opposite to the first conductivity type being bonded to the first semiconductor substrate. A DRAM cell formed by using the semiconductor substrate includes a trench capacitor formed in the first semiconductor substrate through both the second semiconductor substrate and the exposed surface region, and a transfer transistor formed in the second semiconductor substrate.
申请公布号 US5302542(A) 申请公布日期 1994.04.12
申请号 US19930056900 申请日期 1993.05.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KISHI, KOICHI;SAWADA, SHIZUO
分类号 H01L27/10;H01L21/762;H01L21/8242;H01L27/108;(IPC1-7):H01L21/70 主分类号 H01L27/10
代理机构 代理人
主权项
地址