发明名称 CUSTOM IC TESTER OF CELL NEARING FUSE
摘要 Adding several conditions to a custom IC, comparing the measuring value with the reference range value, this apparatus can select the good quality IC fast and correctly at an auto or manual mode. The apparatus performs the steps of: storing a needed program at a one-chip computer (14); composing a peripheral circuit peak detector (13), amplifiers (OP1-OP6), A/D convertor (22), driving circuit for step motor (14), signal generator (3), and latch buffer (21)) to add a suitable condition for measuring; and interfacing a printer circuit (25) to print the data.
申请公布号 KR940006603(B1) 申请公布日期 1994.07.23
申请号 KR19890006644 申请日期 1989.05.18
申请人 DAEWOO ELECTRONICS CO., LTD. 发明人 YU, WAN - DONG
分类号 G01R19/25;(IPC1-7):G01R19/25 主分类号 G01R19/25
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