发明名称 Sample analyzing instrument using first and second plasma torches
摘要 An analytical instrument using a plasma is disclosed. The instrument includes two plasma torches, a first torch of which is used for vaporizing a sample and a second plasma torch is used for exciting the sample. When the analytical instrument is a mass spectrometer, the sample vaporized by the first plasma torch is introduced into the second plasma torch where the sample is ionized. The sample is then mass analyzed. If the sample is a small solid sample, it is momentarily vaporized by the plasma flame generated from the first plasma torch. If the sample is a large solid sample, it can be gradually vaporized from its surface. Therefore, the sample can be analyzed without requiring any pretreatment, e.g., dissolving the sample in an acid.
申请公布号 US5367163(A) 申请公布日期 1994.11.22
申请号 US19930167517 申请日期 1993.12.14
申请人 JEOL LTD. 发明人 OTSUKA, KIICHIRO;IWANAGA, MITSUYASU
分类号 G01N27/62;H01J49/04;H01J49/10;H01J49/26;(IPC1-7):H01J49/02 主分类号 G01N27/62
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