| 发明名称 |
Mechanical capture of count wafer for particle analysis |
| 摘要 |
A particle count probe comprises a wafer having an aperture. A first member is provided having a fluid passageway. A second member is removably mounted to the first member, and cooperates with the first member and the wafer to position the wafer so that the aperture of the wafer aligns with the fluid passageway.
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| 申请公布号 |
US5402062(A) |
申请公布日期 |
1995.03.28 |
| 申请号 |
US19930173735 |
申请日期 |
1993.12.23 |
| 申请人 |
ABBOTT LABORATORIES |
发明人 |
BARNES, THOMAS L.;COLBURN, JAMES W.;DANIAL, CATHERINE L.;RUTNARAK, SANGVORN |
| 分类号 |
B01L3/00;B01L3/02;G01N15/12;(IPC1-7):G01N15/06;G01N27/06 |
主分类号 |
B01L3/00 |
| 代理机构 |
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代理人 |
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| 主权项 |
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